Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM

Journal of Electronic Testing 2016 / 4 Vol. 32; Iss. 2

Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM

Luo, Kun-Lun, Wu, Ming-Hsueh, Hsu, Chun-Lung, Chen, Chen-An
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Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5570-8
Date:
April, 2016
File:
PDF, 1.59 MB
english, 2016
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