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[IEEE 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Paris, France (2015.9.30-2015.10.2)] 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - In-situ monitoring on junction temperature for degradation analysis of light-emitting diodes

Ma, Byungjin, Choi, Sungsooon, Lee, Kwan Hun
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Year:
2015
Language:
english
DOI:
10.1109/THERMINIC.2015.7389608
File:
PDF, 493 KB
english, 2015
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