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Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index
Yang, Siyuan Frank, Chien, Wei-Ting KaryVolume:
64
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2015.2453117
Date:
December, 2015
File:
PDF, 1.06 MB
english, 2015