SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Targets and Backgrounds: Characterization and Representation V - Theory and measurement of bidirectional reflectance for signature analysis
Jafolla, James C., Thomas, David J., Hilgers, John W., Reynolds, William R., Blasband, Chris, Watkins, Wendell R., Clement, Dieter, Reynolds, William R.Volume:
3699
Year:
1999
Language:
english
DOI:
10.1117/12.352935
File:
PDF, 2.53 MB
english, 1999