SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - Polarization scattering from rough surfaces based on the vector Kirchhoff diffraction model
An, Chang-Hyuk, Zeringue, Kyle J., Shaw, Joseph A., Tyo, J. ScottVolume:
5158
Year:
2003
Language:
english
DOI:
10.1117/12.504366
File:
PDF, 129 KB
english, 2003