SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 14 April 2014)] Optical Micro- and Nanometrology V - Time-frequency analysis in optical coherence tomography for technical objects examination
Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Strakowski, Marcin R., Kraszewski, Maciej, Trojanowski, Michal, Plucinski, JerzyVolume:
9132
Year:
2014
Language:
english
DOI:
10.1117/12.2052142
File:
PDF, 633 KB
english, 2014