SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - Complete deformation analysis of transparent samples using digital shearography and holography
Catalan, Francesca Celine I., Santos, Raphael D., Almoro, Percival F., Quan, Chenggen, Asundi, AnandVolume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814616
File:
PDF, 630 KB
english, 2008