Bayesian optimal design of step stress accelerated...

Journal of Systems Engineering and Electronics (IEEE) 2015 / 6 Vol. 26; Iss. 3

Bayesian optimal design of step stress accelerated degradation testing

Li, Xiaoyang, Rezvanizaniani, Mohammad, Ge, Zhengzheng, Abuali, Mohamed, Lee, Jay
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Volume:
26
Language:
english
Journal:
Journal of Systems Engineering and Electronics
DOI:
10.1109/JSEE.2015.00058
Date:
June, 2015
File:
PDF, 1.22 MB
english, 2015
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