[IEEE 2015 International Symposium on VLSI Design,...

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[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - An in-pixel equalizer with kTC noise cancellation and FPN reduction for time-of-flight CMOS image sensor

Huang, Zheng-Wei, Chiu, Chin-Fong, Hsieh, Chih-Cheng
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Year:
2015
Language:
english
DOI:
10.1109/VLSI-DAT.2015.7114520
File:
PDF, 851 KB
english, 2015
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