SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Time and Frequency Metrology - High-resolution spectroscopy of the 88Sr+ single ion optical frequency standard
Dubé, Pierre, Madej, Alan A., Bernard, John E., Shiner, Andrew D., Jones, R. JasonVolume:
6673
Year:
2007
Language:
english
DOI:
10.1117/12.734689
File:
PDF, 291 KB
english, 2007