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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Advances in X-ray Free-Electron Lasers II: Instrumentation - A new compact design of a three-dimensional Ionization Profile Monitor (IPM)
Breede, Heiko, Tschentscher, Thomas, Tiedtke, Kai, Grabosch, Hans-Jürgen, Sachwitz, MartinVolume:
8778
Year:
2013
Language:
english
DOI:
10.1117/12.2021367
File:
PDF, 1.73 MB
english, 2013