SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Research and analysis on new test lenses for calibration of focimeters used for measuring contact lenses
Zhang, Jiyan, Wang, Liru, Ma, Zhenya, Fang, Jiancheng, Wang, ZhongyuVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.717110
File:
PDF, 260 KB
english, 2006