SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on ship wake detection mechanism based on optical backscattering effect
Zhu, Donghua, Zhang, Xiaohui, Rao, Jionghui, Jin, Sheng, Liu, Kai, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866008
File:
PDF, 956 KB
english, 2010