Atomistic Simulation on Indented Defects in Silicon
Trandinh, Long, Cheon, Seong Sik, Kang, WoojongVolume:
13
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2013.8219
Date:
December, 2013
File:
PDF, 1.46 MB
english, 2013