Single-Event Transient Sensitivity Evaluation of Clock...

IEEE Transactions on Nuclear Science 2016 / 2 Vol. 63; Iss. 1

Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Wang, H.-B., Mahatme, N., Chen, L., Newton, M., Li, Y.-Q., Liu, R., Chen, M., Bhuva, B. L., Lilja, K., Wen, S.-J., Wong, R., Fung, R., Baeg, S.
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2509443
Date:
February, 2016
File:
PDF, 1.03 MB
english, 2016
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