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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] X-Ray Optics, Instruments, and Missions II - Achieving desired thickness gradients on flat and curved substrates
Broadway, David M., Platonov, Yuriy Y., Gomez, Luis A., Hoover, Richard B., Walker II, Arthur B. C.Volume:
3766
Year:
1999
Language:
english
DOI:
10.1117/12.363643
File:
PDF, 737 KB
english, 1999