Atomic force microscopy characterization of ultrathin...

Atomic force microscopy characterization of ultrathin polystyrene films formed by admicellar polymerization on silica disks

Chun Hwa See, John O'Haver
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Volume:
89
Year:
2003
Language:
english
Pages:
11
DOI:
10.1002/app.12092
File:
PDF, 916 KB
english, 2003
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