![](/img/cover-not-exists.png)
An XPS and SEM evaluation of six chemical and physical techniques for cleaning of contaminated titanium implants
Jaafar Mouhyi, Lars Sennerby, Jean-jacques Pireaux, Nicolas Dourov, Samir Nammour, Jack Van ReckVolume:
9
Year:
1998
Pages:
10
DOI:
10.1034/j.1600-0501.1998.090306.x
File:
PDF, 1.62 MB
1998