An XPS and SEM evaluation of six chemical and physical...

An XPS and SEM evaluation of six chemical and physical techniques for cleaning of contaminated titanium implants

Jaafar Mouhyi, Lars Sennerby, Jean-jacques Pireaux, Nicolas Dourov, Samir Nammour, Jack Van Reck
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Volume:
9
Year:
1998
Pages:
10
DOI:
10.1034/j.1600-0501.1998.090306.x
File:
PDF, 1.62 MB
1998
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