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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Advanced Display Technology; and Micro/Nano Optical Imaging Technologies and Applications - Simplified indicator for assessing flow velocity by simulation
Lee, Byoungho, Su, Yikai, Gu, Min, Yuan, Xiaocong, Jaque, Daniel, Liu, Jialin, Zhang, Hongchao, Shen, Zhonghua, Lu, Jian, Ni, XiaowuVolume:
9672
Year:
2015
Language:
english
DOI:
10.1117/12.2201053
File:
PDF, 367 KB
english, 2015