Exploring failure mechanisms of near ultraviolet AlGaN/GaN light-emitting diodes by reverse-bias stress in water vapour
Chen, Hsiang, Shen, Huan Yu, Shei, Shih Chang, Kang, Nai Chung, Lai, Hung Che, Chu, Yu Cheng, Chang, Hung WeiVolume:
12
Year:
2015
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/IJNT.2015.066192
File:
PDF, 377 KB
english, 2015