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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Reference wave adaptation in digital lensless Fourier holography by means of a spatial light modulator
Meeser, Thomas, Falldorf, Claas, von Kopylow, Christoph, Bergmann, Ralf B., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889472
File:
PDF, 1.96 MB
english, 2011