A machine learning approach to yield management in...

International Journal of Production Research 2000 / 11 Vol. 38; Iss. 17

A machine learning approach to yield management in semiconductor manufacturing

Shin, Chung Kwan, Park, Sang Chan
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Volume:
38
Language:
english
Journal:
International Journal of Production Research
DOI:
10.1080/00207540050205073
Date:
November, 2000
File:
PDF, 364 KB
english, 2000
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