[IEEE 2015 17th European Conference on Power Electronics and Applications (EPE '15 ECCE Europe) - Geneva, Switzerland (2015.9.8-2015.9.10)] 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) - Electrical performances and reliability of commercial SiC MOSFETs at high temperature and in SC conditions
Maxime, Berthou, Remy, Ouaida, Thibault, Chailloux, Pierre, Brosselard, Sebastion, Oge, Dominique, TournierYear:
2015
Language:
english
DOI:
10.1109/EPE.2015.7309455
File:
PDF, 2.15 MB
english, 2015