[IEEE 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI) - Harbin, China (2013.08.16-2013.08.19)] 2013 IEEE 11th International Conference on Electronic Measurement & Instruments - Nonlinear behavioral modeling and simulation of Rf device with memory effects based on Volterra series
Jinlong, Sun, Maoliu, Lin, Zhilu, WuYear:
2013
Language:
english
DOI:
10.1109/ICEMI.2013.6743108
File:
PDF, 179 KB
english, 2013