[IEEE 2015 21st International Workshop on Thermal...

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[IEEE 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Paris, France (2015.9.30-2015.10.2)] 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Effect of the trench depth on the linear mode capability of trench technology MOSFET-s

Jamborhazi, Szilard, Czett, Andor, Rencz, Marta
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Year:
2015
Language:
english
DOI:
10.1109/THERMINIC.2015.7389634
File:
PDF, 763 KB
english, 2015
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