[IEEE 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Paris, France (2015.9.30-2015.10.2)] 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Effect of the trench depth on the linear mode capability of trench technology MOSFET-s
Jamborhazi, Szilard, Czett, Andor, Rencz, MartaYear:
2015
Language:
english
DOI:
10.1109/THERMINIC.2015.7389634
File:
PDF, 763 KB
english, 2015