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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Mantel, K., Nercissian, Vanusch, Lindlein, N.Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184580
File:
PDF, 6.72 MB
english, 2015