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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Dynamic measurements using a Fizeau interferometer
Sykora, Daniel M., Holmes, Michael L., Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.890853
File:
PDF, 5.54 MB
english, 2011