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Design and optimization of LDMOS-SCR devices with improved ESD protection performance
Liang, Hailian, Cao, Huafeng, Gu, Xiaofeng, Guo, ZixiangLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.02.001
Date:
February, 2016
File:
PDF, 2.01 MB
english, 2016