[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - A novel physical failure analysis of MEMS motion sensor for interface inspection
Huang, Chun-An, Li-Chuang,, Hsu, Kim, Chung, Steel, Chan, TimYear:
2015
Language:
english
DOI:
10.1109/ISQED.2015.7085488
File:
PDF, 1.26 MB
english, 2015