Low-Loss Air-Cavity Through-Silicon Vias (TSVs) for High Speed Three-Dimensional Integrated Circuits (3-D ICs)
Liu, Xiaoxian, Zhu, Zhangming, Yang, Yintang, Ding, RuixueVolume:
26
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/LMWC.2016.2517325
Date:
February, 2016
File:
PDF, 561 KB
english, 2016