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[IEEE 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Rohnert Park, CA, USA (2015.10.5-2015.10.8)] 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - ESD protection design with latchup-free immunity in 120V SOI process
Huang, Yi-Jie, Ker, Ming-Dou, Huang, Yeh-Jen, Tsai, Chun-Chien, Jou, Yeh-Ning, Lin, Geeng-LihYear:
2015
Language:
english
DOI:
10.1109/S3S.2015.7333481
File:
PDF, 606 KB
english, 2015