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SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI - Data modeling enabled real time image processing for target discrimination
Jaenisch, Holger M., Handley, James W., Carroll, Marvin P., Faucheux, Jeffrey P., Thuerk, Marcel, Goetz, Ruediger, Egorov, Mark, Wiesenfeldt, Martin, Holst, Gerald C.Volume:
5784
Year:
2005
Language:
english
DOI:
10.1117/12.603398
File:
PDF, 1.17 MB
english, 2005