Optical characterization of gaps in directly bonded Si...

Applied Optics 2015 / 12 Vol. 54; Iss. 34

Optical characterization of gaps in directly bonded Si compound optics using infrared spectroscopy

Gully-Santiago, Michael, Jaffe, Daniel T., White, Victor
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Volume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.54.010177
Date:
December, 2015
File:
PDF, 1.60 MB
english, 2015
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