Characteristics of an Image Sensor with Early-Vision...

Metrology and Measurement Systems 2012 / 01 Vol. 19; Iss. 2

Characteristics of an Image Sensor with Early-Vision Processing Fabricated in Standard 0.35 μm Cmos Technology

Jendernalik, Waldemar, Jakusz, Jacek, Blakiewicz, Grzegorz, Szczepański, Stanisław, Piotrowski, Robert
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Volume:
19
Language:
english
Journal:
Metrology and Measurement Systems
DOI:
10.2478/v10178-012-0017-8
Date:
January, 2012
File:
PDF, 1.08 MB
english, 2012
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