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Nondestructive imaging of buried interfaces in SiC and GaN Schottky contacts using scanning internal photoemission microscopy
Shiojima, Kenji, Yamamoto, Shingo, Kihara, Yuhei, Mishima, TomoyoshiVolume:
8
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.8.046502
Date:
April, 2015
File:
PDF, 1.05 MB
english, 2015