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[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - Active-precharge hammering on a row induced failure in DDR3 SDRAMs under 3× nm technology
Park, Kyungbae, Baeg, Sanghyeon, Wen, ShiJie, Wong, RichardYear:
2014
Language:
english
DOI:
10.1109/iirw.2014.7049516
File:
PDF, 850 KB
english, 2014