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Investigating the complex mechanism of B migration in a magnetic-tunnel-junction trilayer structure—a combined study using XPS and TOF-SIMS
Ying, Ji-Feng, Ji, Rong, Lim, Sze Ter, Tran, Michael N, Wang, Chen Chen, Ernult, FranckVolume:
49
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/49/6/065004
Date:
February, 2016
File:
PDF, 1.19 MB
english, 2016