[IEEE 2015 IEEE 2nd International Conference on Recent...

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[IEEE 2015 IEEE 2nd International Conference on Recent Trends in Information Systems (ReTIS) - Kolkata, India (2015.7.9-2015.7.11)] 2015 IEEE 2nd International Conference on Recent Trends in Information Systems (ReTIS) - A novel palmprint authetication system by XWT based feature extraction and BFOA based feature selection and optimization

Sanyal, Nandita, Chatterjee, Amitava, Munshi, Sugata
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Year:
2015
Language:
english
DOI:
10.1109/ReTIS.2015.7232922
File:
PDF, 457 KB
english, 2015
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