SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII - Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectance surfaces
Edgar, Michael L., Cully, Scott L., Jelinsky, Sharon R., Jelinsky, Patrick N., Siegmund, Oswald H. W., Warren, John K., Siegmund, Oswald H. W., Gummin, Mark A.Volume:
2808
Year:
1996
Language:
english
DOI:
10.1117/12.256005
File:
PDF, 516 KB
english, 1996