[IEEE 2015 31st Thermal Measurement, Modeling &...

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[IEEE 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2015.3.15-2015.3.19)] 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Temperature sensitivity and noise in thermoreflectance thermal imaging

Shakouri, Alexander, El Sayed Kayed, Mohamed, Ziabari, Amirkoushyar, Kendig, Dustin, Vermeersch, Bjorn, Bahk, Je-Hyeong, Shakouri, Ali
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Year:
2015
Language:
english
DOI:
10.1109/SEMI-THERM.2015.7100163
File:
PDF, 634 KB
english, 2015
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