Reliability Assessment of Power MOSFETs Working in...

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IEEE Transactions on Industry Applications 2015

Reliability Assessment of Power MOSFETs Working in Avalanche Mode Based on a Thermal Strain Direct Measurement Approach

Russo, Sebastiano, Testa, Antonio, De Caro, Salvatore, Scimone, Tommaso, Panarello, Saverio, Patane, Salvatore, Scelba, Giacomo, Scarcella, Giuseppe
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2015.2500890
File:
PDF, 1.39 MB
english, 2015
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