[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - A quantitative model of equipment development quality risk conduction
Zhou, Shao-qi, Chang, Wen-bing, Zhou, Sheng-han, Liu, WeiYear:
2015
Language:
english
DOI:
10.1109/RAMS.2015.7105089
File:
PDF, 755 KB
english, 2015