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[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Rapid prototyping and test before silicon of integrated pressure sensors

Voinea, Adrian I., Kampfer, Stefan
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Year:
2015
Language:
english
DOI:
10.1109/TEST.2015.7342402
File:
PDF, 962 KB
english, 2015
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