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On-Wafer Single-Pulse Thermal Load–Pull RF Characterization of Trapping Phenomena in AlGaN/GaN HEMTs
Benvegnu, Agostino, Laurent, Sylvain, Meneghini, Matteo, Barataud, Denis, Meneghesso, Gaudenzio, Zanoni, Enrico, Quere, RaymondYear:
2016
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2016.2523991
File:
PDF, 2.06 MB
english, 2016