Robust Quantile Analysis for Accelerated Life Test Data

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IEEE Transactions on Reliability 2015

Robust Quantile Analysis for Accelerated Life Test Data

Chen, Nan, Tang, Yanlin, Ye, Zhi-Sheng
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2015.2500368
File:
PDF, 2.59 MB
english, 2015
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