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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Physics and Simulation of Optoelectronic Devices XXIV - A Monte Carlo simulator for noise analysis of avalanche photodiode pixels in low-light image sensing
Witzigmann, Bernd, Osiński, Marek, Arakawa, Yasuhiko, Resetar, Tomislav, Süss, Andreas, Vermandere, Elke, Karpiak, Bogdan, Puers, Robert, Van Hoof, ChrisVolume:
9742
Year:
2016
Language:
english
DOI:
10.1117/12.2210994
File:
PDF, 3.38 MB
english, 2016