SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - Passive digital image authentication algorithm based on Tchebichef moment invariants
Li, Mei, Gu, Zongyun, Kan, Junling, Xin, Jiezhi, Zhu, Lianqing, Wang, ZhongyuVolume:
7997
Year:
2011
Language:
english
DOI:
10.1117/12.892167
File:
PDF, 776 KB
english, 2011