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SPIE Proceedings [SPIE International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Singapore, Singapore (Tuesday 9 April 2013)] International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Systematic errors in digital image correlation induced by environment temperature variation around the digital camera
Ma, Qinwei, Quan, Chenggen, Qian, Kemao, Ma, Shaopeng, Zhang, Yongfa, Asundi, AnandVolume:
8769
Year:
2013
Language:
english
DOI:
10.1117/12.2019198
File:
PDF, 597 KB
english, 2013