SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Digital Photography X - Image sensor noise profiling by voting based curve fitting
Sampat, Nitin, Tezaur, Radka, Battiato, Sebastiano, Fowler, Boyd A., Battiato, S., Puglisi, G., Rizzo, R., Bosco, A., Bruna, A. R.Volume:
9023
Year:
2014
Language:
english
DOI:
10.1117/12.2038239
File:
PDF, 1.04 MB
english, 2014