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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Digital Photography X - LoG acts as a good feature in the task of image quality assessment
Sampat, Nitin, Tezaur, Radka, Battiato, Sebastiano, Fowler, Boyd A., Mou, Xuanqin, Xue, Wufeng, Chen, Congmin, Zhang, LeiVolume:
9023
Year:
2014
Language:
english
DOI:
10.1117/12.2038982
File:
PDF, 921 KB
english, 2014